PCC – How it Works

Probe Polish®, Probe Form®, LCxK and SWE are designed to clean and maintain shaped probe tips.

Probe Lap®, Probe Scrub®, PF3, PET/75 and BC3 developed to clean flat tip probe with minimal wear.

Probe VerticalTM an innovative material that cleans, and maintains pointed probe tips.

MIPOX Materials Selection Matrix


Improved equipment utilization – Eliminate prober optical recognition errors, reduce operator intervention, and reduce probe card inventories.

Increased wafer yield – Controlled and stable contact resistance, reduced site-to-site dependent failures, with thermal stability across -50°C to +200°C.

Increased throughput – Minimize the need for offline cleaning, extend probe card life, and maintain tip shape.