Probe Polish®, Probe Form®, LCxK and SWE are designed to clean and maintain shaped probe tips.
Probe Lap®, Probe Scrub®, PF3, PET/75 and BC3 developed to clean flat tip probe with minimal wear.
Probe VerticalTM an innovative material that cleans, and maintains pointed probe tips.
MIPOX Materials Selection Matrix
Benefits
Improved equipment utilization – Eliminate prober optical recognition errors, reduce operator intervention, and reduce probe card inventories.
Increased wafer yield – Controlled and stable contact resistance, reduced site-to-site dependent failures, with thermal stability across -50°C to +200°C.
Increased throughput – Minimize the need for offline cleaning, extend probe card life, and maintain tip shape.