Probe Polish®, Probe Form®, LCxK and SWE are designed to clean and maintain shaped probe tips.
Probe Lap®, Probe Scrub®, PF3, PET/75 and BC3 developed to clean flat tip probe with minimal wear.
Probe VerticalTM an innovative material that cleans, and maintains pointed probe tips.
MIPOX Materials Selection Matrix
Improved equipment utilization – Eliminate prober optical recognition errors, reduce operator intervention, and reduce probe card inventories.
Increased wafer yield – Controlled and stable contact resistance, reduced site-to-site dependent failures, with thermal stability across -50°C to +200°C.
Increased throughput – Minimize the need for offline cleaning, extend probe card life, and maintain tip shape.