SEMI Fab Back-End – MGN International

Contamination monitoring and control is still important at the back-end of the semiconductor manufacturing. Prevention and removal of contaminants from the process and testing tools are critical to improve yield and maintain high quality and profitability.

Probe Card Clean

Improve yield
Easier and less downtime than manual cleaning
We offer both Mipox and ITS brand products with a wide variety of structures, shapes, sizes, loading, abrasive size, and aggressiveness.
Cleaning wafers, chucks, self-application sheets for both online and offline needs

Probe Card Conditioning

Clean and reconditions probe tips to extend functional life
Maintain tip shape for proper contact and oxide penetration
Products include Probe Form, Probe Refresh, SWE, LCxK
Customized solutions available

Test Contactor Cleaning

Improve yield
Easier and less downtime than manual cleaning
ITS surrogate chips offer fast and automated online cleaning process
Mipox low cost solutions for offline cleaning

Portable Cleanzone System

ISO Class 1 capable: less than 10 particles/m3 at 0.1um
Fast: establishes a clean-zone in less than 3 minutes (Turn off when not in use)
Portable: plug-n-play, standard electric outlet
Cost Effective: lower initial cost AND operating cost than standard traditional clean-room
Applications: Ultra-clean protection of sensitive test samples, critical processes, and instruments. Localized filtration of particle generating spots

Air Particle Counting

Handheld / Portable : HDD particle generation test, particle source detection, clean-room qualifications, spot checks, move and measure
Multipoint / Manifold : continuous monitoring of production / filling area cleanliness, capable down to ≥0.08um and up to ≥100.0um, sampling tubes enables connection to tools and enclosed spaces
Various flow-rates available to meet application requirements